2013 /2012 /2011 /2010 / 2009 / 2008 / 2007/ 2006 / 2005 /2004 / 2003 / 2002 / 2001/ 2000 / ~ 1999

- D. Kim, H. Kim and Y. Eo , " Experimental characterisations of thin film transmission line losses," Electronics Letters, vol. 49, no. 17, Aug. 2013.
- D. Kim, H. Kim and Y. Eo , " A novel transmission line characterisation based on measurement data reconfirmation ," International Journal of Electronics, Published online: 29, Apr. 2013.

- D. Kim, H. Kim and Y. Eo , " Analytical eye-diagram determination for the efficient and accurate signal integrity verification of singal integrity verification of single interconnect lines," IEEE Trans. Comput.-Aided Design Integr. Circuits Syst. , vol. 31, no. 10, pp. 1536-1545, Oct. 2012.

- H. Kim and Y. Eo , " Compact CAD models for the signal integrity verification of multi-coupled transmission lines ," IEICE Trans. Fundamentals , vol. E93-A, no. 4, pp. 752-760, April 2010.

- D. Kim and Y. Eo , " S-parameter-measurement-based time-domain signal transient and crosstalk noise characterizations of coupled transmission lines ," IEEE Trans. Adv. Packag. , vol. 32, no. 1, pp. 152-163, Feb. 2009.

2008

- H. Kim and Y. Eo , " High-frequency-measurement-based circuit modeling and power/ground integrity evaluation of integrated circuit packages ," IEEE Trans. Adv. Packag. , vol. 31, no. 4, pp. 910-918, Nov. 2008.

- T. Kim and Y. Eo , " Analytical CAD models for signal transients and crosstalk noise of inductance-effect-prominent multi-coupled RLC interconnect lines ," IEEE Trans.
*Computer-Aided Design*, vol. 27, no. 7, pp.1214-1227, July 2008.

2005 - S. Hwang, J. Shim, and Y. Eo, " Ohmic Contacts of Pd/Zn/M(=Pd or Pt)/Au to p-Type InP , "
*J. of Kor. Phys. Society*, vol. 46, no. 4, pp. L751-L755, Apr. 2005.

2004 - Y. Eo, S. Shin, W. R. Eisenstadt, and J. Shim, " A decoupling technique for efficient timing analysis of VLSI interconnects with dynamic circuit switching , " IEEE Trans. Computer-Aided Design , vol. 23, no. 9, pp. 1321-1337, Sep. 2004.

- D. Kim, J. Shim, D. Jang, and Y. Eo, " Fe-doped InP semi-insulating buried heterostructure for high speed and high power operations in directly modulated semiconductor laser , " IEEE Electronics Letters , vol. 40, no. 15, pp. 937-938, July 2004.

- S. Shin, Y. Eo, W. R. Eisenstadt, J. Shim, " Analytical models and algorithms for the efficient signal integrity verification of inductance-effect-prominent multicoupled VLSI circuit interconnects ,"
*IEEE Trans. VLSI Syst.*, vol. 12, no. 4, pp. 395-407, Apr. 2004.

2003 - Y. Eo, W. R. Eisenstadt, J. Choi, W. Jin, and J. Shim, " A compact multilayer IC package model for efficient simulation, analysis, and design of high-performance VLSI circuits , "
*IEEE Trans. Adv. Packag.*, vol. 26, no. 4, pp. 392-401, Sep. 2003.

2002 - Y. Eo, S. Shin, W. R. Eisenstadt, and J. I. Shim, " Generalized traveling-wave-based waveform approximation technique for the efficient signal integrity verification of multicoupled transmission line system ,"
*IEEE Trans. Computer-Aided Design*, vol. 21, no. 12, pp. 1489-1497, Dec. 2002.

- D. Bang, J. Shim, J. Kang, M. Um, S. Park, S. Lee, D. Jang, and Y. Eo, " High-temperature and high-speed operation of a 1.3-um uncooled InGaAsP/InP DFB laser , " IEEE Photon. Technol. Lett. , vol. 14, no. 9, pp. 1240-1242, Sep. 2002.

- Y. Yoon, J. Shim, D. Jang, J. Kim, Y. Eo, and F. Rhee, " Transmission spectra of fabry-perot etalon filter for diverged input beams , " IEEE Photon. Technol. Lett. , vol. 14, no. 9, pp 1315-1317, Sep. 2002.

- J. Shim, J. Kim, D. Jang, Y. Eo, and S. Arai, " Facet reflectivity of a spot-size-converter integrated semiconductor optical amplifier , "
*IEEE J. Quantum Electron.*, vol. 38, no. 6, pp. 665-673, Jun. 2002.

- Y. Eo, J. Shim, and W. R. Eisenstadt, " A traveling-wave-based waveform approximation technique for the timing verification of single transmission lines , "
*IEEE Trans. Computer-Aided Design*, vol. 21, no. 6, pp. 723-730, Jun. 2002.

2001 - D. Jang, J. Shim, J. Lee, and Y. Eo, " Asymmetric output characteristics in 1.3-um spot-size converted laser diodes , "
*IEEE J. Quantum Electron.*, vol. 37, no. 12, pp. 1611-1617, Dec. 2001.

- W. Jin, Y. Eo, W. R. Eisenstadt, and J. Shim, " Fast and accurate quasi-3-dimensional Capacitance Determination of Multi-Layer VLSI Interconnects , "
*IEEE Trans. VLSI Syst.,*vol. 9, no. 3, pp. 450-460, Jun. 2001.

2000 - Y. Eo, W. R. Eisenstadt, and J. Shim, " S-parameter measurement-based high-speed signal transient characterization of VLSI interconnects on SiO 2 -Si substrate , " IEEE Trans. Adv. Packag. , vol. 23, no. 3, pp. 470-479, Aug. 2000.

- W. Jin, S. Yoon, Y. Eo, and J. Kim, " Experimental characterization and modeling of transmission line effects for high-speed VLSI circuits interconnects , " IEICE Trans. Electronics , vol. E83-C, no. 5, pp. 728-735, May 2000 .

- Y. Eo, W. R. Eisenstadt, J. Jeong, and O. Kwon, " New simultaneous switching noise analysis and modeling for high-speed and high density CMOS IC package design , " IEEE Trans. Adv. Packag. , vol. 23, no. 2, pp. 303-312, May 2000.

- Y. Eo, W. R. Eisenstadt, J. Jeong, and O. Kwon, " A new on-chip interconnect crosstalk model and experimental verification for CMOS VLSI circuit design , " IEEE Trans. Electron Devices , vol. 47, no. 1, pp. 129-140, Jan. 2000.

~ 1999 - W. Jin, H. Yoo, and Y. Eo, " Non-uniform multi-layer IC interconnect transmission line characterization for fast signal transient simulation of high-speed/high-density VLSI circuits , " IEICE Trans. Electronics , vol. E82-C, no. 6, pp. 955-966, Jun. 1999.

- S. Lee, J. Jeong, J. Hwang, Y. Eo, and O. Kwon, " Utilization of photon emission microscopy in determining drain junction property of submicron NMOSFETs , " J. of Kor. Phcis. Society , vol. 33, pp. S220-S223, Nov. 1998.

- Y. Kim, Y. Park, Y. Eo, O. Kwon, and C. Lee, " Simulator for interconnects and general multiline analysis (SIGMA): simulation algorithm of lossy multiple transmission lines , " J. of Kor. Phys. Society , vol. 33, pp. 129-134, Nov. 1998.

- S. Lee, H. Lee, Y. Lee, J. Jeong, Y. Eo, O. Kwon and C. Lee , " Trade-off between hot carrier effect and current driving capability due to drain contact structures in deep submicron MOSFETs, " Jpn. J. Appl. Phys. , vol. 37 Part 1. no. 3B, pp. 1041-1046, Mar. 1998.

- Y. Eo and W. R. Eisenstadt, " Generalized coupled interconnect transfer function and high-speed signal simulations , " IEEE Trans. Microwave Theory Tech. , vol. 43, no. 5, pp. 1115-1121, May 1995.

- Y. Eo and W. R. Eisenstadt, " Simulations and measurements of picosecond signal transients, propagation, and crosstalk on lossy VLSI interconnect , " IEEE Trans. Comp., Packag., Manufact. Technol. A , vol. 18 no. 1. pp. 215-225, Mar. 1995.

- Y. Eo and W. R. Eisenstadt, " High speed VLSI interconnect modeling based on S-parameter measurements , " IEEE Trans. Comp., Hybrids, Manufact. Technol. , vol. 16, no. 5, pp. 555-562, Aug. 1993.

- W. R. Eisenstadt and Y. Eo, " S-parameter-based IC interconnect transmission line characterization , " IEEE Trans. Comp., Hybrids, Manufact. Technol. , vol. 15, no. 4, pp.483-490, Aug. 1992.